E6607C 

回收:謝: (同號)

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東莞市金泰電子儀器（回收）有限公司

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  *銷售/回收儀器儀表，回收倒閉工廠儀器儀表，個人閑置儀器/等.世界產(chǎn)品、不論多少,不分好壞、咨詢！

地址：廣東省東莞市塘廈鎮(zhèn)塘廈大道18號

主要特性與技術指標
Integrated Multiport enables efficient Multi-DUT test
Integrated multiport provides for parallel receiver test / fast switched transmitter test making effective use of test equipment resources
Lower cost, smaller footprint, lower power consumption verses use of external multiport adapter
Fully compatible with software written for E6607A / E6607B for seamless integration in manufacturing
Add external display, mouse, and keyboard, for full manual control and functionality equivalent to E6607B & MPA
Anticipate your wireless device manufacturing test needs
Benefit from an architecture that is optimized for lower-cost next generation non-signaling test
Add multi-format standards-based calibration and verification test support as needed for LTE TDD/FDD, HSPA+, W-CDMA, 1xEV-DO, cdma2000?, GSM, EDGE-Evo, TD-SCDMA, WiMAXTM, Bluetooth?, GPS/GNSS, and more
Ensure your test system is future proof due to its modern, scalable architecture
Accelerate test development
Ensure seamless transition from NPI to production with proven X-Series analyzer measurements science
Simplify signal creation to synchronize, control, and test your wireless device with Signal Studio software
Streamline test plan creation and troubleshooting in a graphical interface with Sequence Studio software
Reduce time to volume manufacturing with Chipset Software to optimize device calibration and verification
Achieve fast and accurate measurements
Maximize throughput with fast-sequenced, non-signaling test modes for modern chipsets
Speed up your test plan in sequence analyzer mode with single acquisition, multiple measurements
Increase your production yield with superior measurement accuracy
Cost effective integrated Multiport Adapter with metrology grade precision and balancing