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飛馳(北京)科學(xué)儀器有限公司

化工儀器網(wǎng)>產(chǎn)品展廳>物理特性分析儀器>粒度儀>顆粒計數(shù)器> 氣載顆粒計數(shù)器

氣載顆粒計數(shù)器

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顆粒計數(shù)器微米級氣載顆粒

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真理光學(xué)儀器有限公司專注于Gao端顆粒表征儀器的研發(fā)和制造,產(chǎn)品涵蓋激光(衍射法)粒度分析儀、動態(tài)光散射納米粒度及Zeta電位分析儀以及顆粒圖像分析儀,既有實(shí)驗(yàn)室儀器,又有在線檢測系統(tǒng)。真理光學(xué)秉持“科學(xué)態(tài)度,工匠精神”,為用戶提供世界Xian進(jìn)的Gao端產(chǎn)品和服務(wù)。

真理光學(xué)匯集了以張福根博士為代表的全國顆粒表征領(lǐng)域的頂尖人才。張福根博士現(xiàn)任本公司董事長兼首Xi科學(xué)家,還擔(dān)任全國顆粒表征及分檢與篩網(wǎng)標(biāo)準(zhǔn)化技術(shù)委員會副主任委員、天津大學(xué)兼職教授,曾擔(dān)任中國顆粒學(xué)會副理事長,同時也是“歐美克”字號公司的創(chuàng)始人。曾擔(dān)任英國某粒度儀器公司中國總經(jīng)理20余年的秦和義先生擔(dān)任本公司商務(wù)總經(jīng)理,中國顆粒學(xué)會青年理事潘林超博士、陳進(jìn)博士擔(dān)綱公司的研發(fā)主力。

激光(衍射法)粒度儀雖然已得到廣泛應(yīng)用,但它并不Wan美,不論是科學(xué)基礎(chǔ)方面,還是技術(shù)方案方面。真理光學(xué)的團(tuán)隊(duì)針對當(dāng)前市面上儀器存在的不足,展開了系統(tǒng)的理論研究和技術(shù)創(chuàng)新,發(fā)現(xiàn)了衍射光斑(愛里斑)的反常變化現(xiàn)象(ACAD),解釋了為什么不能測量3μm左右的聚苯乙烯微球,并給出了反常區(qū)(不能測量粒徑)的一般公式;研究了衍射儀器的測量上限和下限;研究了顆粒折射率偏差對測量結(jié)果的影響,發(fā)明了兩種根據(jù)散射光分布估算顆粒折射率的方法;提出了斜置梯形窗口技術(shù)方案(Zhuan利),解決了前向超大角測量盲區(qū)的問題,使衍射儀器的亞微米顆粒測量水平顯著提高;提出了統(tǒng)一的反演算法(專有技術(shù)),消除了不同計算模式給出不同結(jié)果的尷尬;設(shè)計出了高達(dá)20Kfps的超高速并行數(shù)據(jù)采樣電路,使干法測量的精度不亞于濕法測量,對高速噴霧場的測量(時間)分辨率也更高。

在納米粒度及Zeta電位儀方面,真理光學(xué)提出了比相位分析法(PALS)更先進(jìn)的余弦擬合相位分析法(CF-PALS),用光纖分束取代了傳統(tǒng)的平板分束鏡分束,用光纖內(nèi)光干涉取代了自由空間干涉,使Zeta電位的測量重復(fù)性大幅度提高。

Linkoptik Instruments specializes in the development and manufacture of high-end particle characterization instruments, including laser (diffraction) particle size analyzers, dynamic light scattering nano particle size and zeta potential analyzers, and particle image analyzers, both laboratory instruments and online inspection systems. Linkoptik Instruments upholds the "scientific attitude and craftsmanship" to provide customers with the world's advanced high-end products and services.

Linkoptik Instruments has gathered the top talents in the field of particle characterization in China, represented by Dr. Fugen Zhang. Dr. Zhang is the Chairman and Chief Scientist of our company, and is also the Vice Chairman of the National Technical Committee for Particle Characterization and Sieving and Sieve Standardization, a part-time professor of Tianjin University, and the Vice Chairman of the Chinese Particle Society. Mr. Qin He Yi, who was the general manager of a particle size instrument company in China for more than 20 years, is the commercial general manager of the company, and Dr. Pan Linchao and Dr. Chen Jin, the young directors of the Chinese Particle Society, are the main R&D team of the company.

Although laser (diffraction) particle size measurement has been widely used, it is not perfect, both in terms of scientific basis and technical solutions. The team at Truth Optics has conducted systematic theoretical research and technological innovation to address the shortcomings of the current instruments on the market, discovered the phenomenon of anomalous variation of diffraction spot (Airy spot) (ACAD), explained why polystyrene microspheres around 3 μm cannot be measured, and gave a general formula for the anomalous zone (not measuring particle size); studied the upper and lower measurement limits of diffraction instruments; studied the effect of particle The influence of refractive index deviation on the measurement results was studied, and two methods for estimating the refractive index of particles based on the scattered light distribution were invented; an oblique trapezoidal window technical solution (patented) was proposed, which solved the problem of the blind area of the forward oversized angle measurement and significantly improved the submicron particle measurement level of the diffraction instrument; a unified inversion algorithm (proprietary technology) was proposed, which eliminated the embarrassment of different calculation modes giving different results; the design of The ultra-high speed parallel data sampling circuit of up to 20Kfps has been designed, which makes the accuracy of dry measurement no less than that of wet measurement, and the measurement (time) resolution of high-speed spray field is also higher.

In nanometer particle size and zeta potential measurement, Linkoptik Instruments has proposed a more advanced cosine fitted phase analysis method (CF-PALS) than PALS, replacing the traditional flat beam splitter mirror beam splitting with fiber optic beam splitting, and replacing free space interference with optical interference inside the fiber, which has greatly improved the repeatability of zeta potential measurement.




專注于顆粒(包含粉體顆粒、乳膠顆粒和液體霧滴)測試技術(shù)的研發(fā)和儀器的生產(chǎn)銷售

產(chǎn)地類別 國產(chǎn) 價格區(qū)間 面議
儀器種類 光學(xué)顆粒計數(shù)器 應(yīng)用領(lǐng)域 化工

目前已有的光阻法顆粒計數(shù)器已經(jīng)廣泛應(yīng)用于無塵室的空氣中顆粒(氣載顆粒)監(jiān)控, 但是由于光路原理和采樣算法等局限設(shè)計, 現(xiàn)有的光阻法儀器無法對空氣中的大顆粒進(jìn)行較為準(zhǔn)確的采樣以及測量。

本儀器基于顆粒消光原理,采用光學(xué)空間低通濾波硬件技術(shù),結(jié)合衍射修正算法,能準(zhǔn)確測量微米級氣載顆粒的粒度分布和個數(shù),覆蓋了當(dāng)前儀器市場上未能監(jiān)控大顆粒的痛點(diǎn)。


主要性能指標(biāo)
   ◆ 測量范圍28μm~640μm
   ◆ 單機(jī)報告顯示9粒徑通道,內(nèi)置36粒徑通道
   ◆ 粒徑重復(fù)性標(biāo)準(zhǔn)誤差<2%
◆ 粒徑準(zhǔn)確性標(biāo)準(zhǔn)誤差<5%
◆ 全量程顆粒數(shù)量誤差<10%
◆ 風(fēng)機(jī)流量偏差±2L/min


APC 610氣載顆粒計數(shù)器vs傳統(tǒng)光阻法顆粒計數(shù)器


真理光學(xué)APC 610 氣載顆粒計數(shù)器


傳統(tǒng)光阻法顆粒測試

能夠測量顆粒的真實(shí)幾何粒徑

只能測量顆粒的等效消光粒徑

測量準(zhǔn)確性不受顆粒的折射率和吸收系數(shù)影響,無論什么材料組成的顆粒,都能得到準(zhǔn)確的測量結(jié)果

受顆粒材料的折射率和吸收系數(shù)影響, 比如較低吸收系數(shù)的顆粒, 測量結(jié)果會偏小;反之,測量結(jié)果會偏大

測量準(zhǔn)確性高,粒徑測量的理論誤差不超過1%

準(zhǔn)確性無保證

能提供詳盡的粒度分布數(shù)據(jù)

只能提供粗略的粒度分段數(shù)據(jù)

測量單元與驅(qū)動單元分離,并與采樣斗直接相連設(shè)計,測量單元可放置到狹小空間測量,避免了管道污染對測量準(zhǔn)確性的影響

只能把采樣斗放置到測量空間,管道內(nèi)的顆粒沉積與污染直接影響測量結(jié)果的準(zhǔn)確性

測量單元內(nèi)測量室和采樣斗可拆卸,便于清潔和更換;而管道的污染對測量無影響

測量室清潔困難,管道難以徹底清洗




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